Coordinate Metrology Systems Conference (CMSC) 2013 Brims with 3D Measurement Innovations and Information

Email Contact Coordinate Metrology Society conducts first Level-One Certification Examination for Metrologists

Benbrook, TX – August 5, 2013 – The Coordinate Metrology Society announced today its 29th annual Coordinate Metrology Systems Conference (CMSC) attracted more than 500 professionals worldwide in the 3D portable measurement and inspection field. CMSC 2013 was held July 22-26, 2013 at the Sheraton San Diego Hotel and Marina in San Diego, CA.  A record-breaking 27 technical presentations were conducted in five sessions during the conference. The weeklong conference and technology expo was attended by manufacturers, engineers, scientists, quality control specialists, metrologists, educators, and students from six countries. The Coordinate Metrology Society is comprised of professional and novice users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals.

Portable Metrology Experts Cover Wide Spectrum of Industrial Measurement Applications
               The CMSC technical presentations covered measurement accuracy and performance, metrology in aerospace tooling and manufacturing, integration of laser trackers and robotics, coordinate measurement systems, equipment optimization, 3D scanning and sensors, and other applications in quality control, production, and precision assembly. The diverse speaker roster included four academic institutions, six science laboratories, nine master technology users, four metrology service providers and four original equipment manufacturers (OEMs). Special guests from NIST and ASTM updated the audience on the progress of emerging industry standards and initiatives. The agenda included speakers from The Boeing Company, Lockheed Martin, AIP Aerospace, Electroimpact, Nuclear AMRC/Manchester University (UK), National Institute of Standards and Technology (NIST), UNC Charlotte, National Physical Laboratory (NPL - UK), Fermilab, ISRO Satellite Centre (India), University of Ontario Institute of Technology (Canada), University of Bath (UK), and other leaders in the field.

CMS Launches First Level-One Certification Program
               After five years of dedicated work, the Coordinate Metrology Society launched the industry’s first Level-One Certification Program for Portable 3D Metrology. Examinations were held during the week at the conference. The CMS Certification credential aids in quantifying an employee’s knowledge of metrology, which is essential to ISO certified manufacturers and companies with Quality Management Systems. Applicants for the Level-One Certification must submit an application, meet eligibility requirements, sign the CMS code of ethics, and pass a peer review. The Level-One examination is a proctored, online assessment covering foundational theory and practice common to most portable 3D Metrology devices. The Level-Two Certification exam on a portable CMM (coordinate measuring machine) was also piloted at the 2013 CMSC.

A Packed Exhibition Hall, Fourth Annual Measurement Study
The CMSC also showcased 49 exhibitors in the Exhibition Hall where attendees viewed new products, services, and solutions for their portable metrology requirements. The conference also offered advanced workshops covering GD&T, the CMSC Measurement Study Review, and Good Measurement Practice Tips.

After the first successful Gage R&R Study in 2010, the Coordinate Measurement Society has organized large-scale, interactive studies each year in the Exhibition Hall. Garnering enthusiastic participation from conference attendees, this year’s study was conducted to evaluate how the decisions made by metrologists during and after measurement affect the measurement result.  The objective of the 2013 study was to engage the metrology community in practical methodology required to support certified operators and programmers. The results of the study will be released later this year.

The conference agenda also included networking events, User Group Meetings, the popular 5 Billion Micron Fun Run/Walk, and the annual CMSC Banquet. Many CMSC visitors attended the Friday tour of the USS Midway Museum in downtown San Diego. The Coordinate Metrology Society also made a donation in support of the Jacobs & Cushman San Diego Food Bank.

New CMS Officer Slate

The Coordinate Metrology Society also elected officers for the 2014 membership year. Ron Hicks will serve as the 2014 CMSC Chairman, with Ron Rode in the supporting role of Vice Chairman. Robert McIvor presided as the Chairman of this year’s conference, and will serve as Past Chairman. Other members serving on the 2013 CMS Executive Committee are Michael Raphael, Scott Sandwith, Gary Confalone, Randy Gruver, Nick Moffitt, Rina Molari, Jafar Jamshidi, Lisa Spoon, Jan Rode, Cali Schwartzly, Tara Mitchell, and Ulysses Green. Nathalie Blanco and Kevin Bevan were elected to serve on the 2014 Executive Committee. To learn more about the Coordinate Metrology Society and the 2014 CMSC to be held in North Charleston, SC, please visit regularly, as the web site is updated throughout the year.

About the Coordinate Metrology Society
The Coordinate Metrology Society is a membership of users, service providers, and OEM manufacturers of close-tolerance industrial coordinate measurement systems, software, and peripherals. The society gathers each year to gain knowledge of the advancements and applications of any measurement system or software solution that produces and uses 3D coordinate data. For more information about the CMS and how to join the organization, visit their web site at
About the Coordinate Metrology Systems Conference
The Coordinate Metrology Systems Conference is an annual event sponsored by the Coordinate Metrology Society. Established in 1984, the five-day conference is held each year at a different location, and attracts visitors from around the globe.  CMSC has achieved world renown for its comprehensive program of top-shelf white papers and applications presentations given by industry experts from science/research laboratories and leading manufacturing industries. No other trade show rivals the high level of authoritative information provided by CMS members and master users of metrology instrumentation, software, and peripheral equipment for quality control, quality production, and precision assembly and metrology-aided alignment.

PR Contact: Belinda Jones, HiTech Marketing, 860-399-1147, Email Contact

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